Description
The NanoCal ProFiber Micrometer represents a breakthrough in dimensional measurement technology, specially engineered for engineers, technicians, and materials scientists working with ultra-thin, delicate, or flexible materials such as polymer films, optical fibers, microelectronics, and advanced composites. Utilizing an integrated fiber-optic interferometric sensing module, the ProFiber achieves true sub-micron accuracy (±0.05 µm) without any mechanical contact or traditional spindle movement, eliminating sample deformation or compression errors common with conventional micrometers.
The device features a compact ergonomic frame constructed from aerospace-grade aluminum with a carbon-fiber reinforced handle for weight reduction and thermal stability. Measurement is initiated by placing the sample between two parallel sapphire-coated measurement planes, where a pair of fiber-optic interferometers determine thickness through light wave phase shifts rather than mechanical displacement.
Key technical specifications include:
– Measurement Range: 0–5 mm
– Resolution: 0.01 µm (10 nm)
– Accuracy: ±0.05 µm
– Sampling Rate: 1000 Hz for real-time thickness fluctuation monitoring
– OLED Display with customizable measurement modes
– Bluetooth 5.2 and USB-C connectivity for live data streaming and software integration
– Rechargeable 12-hour battery life with rapid charging
The accompanying NanoCal Suite software enables automated calibration against certified gauge blocks, detailed trend analysis, and export of measurement data in multiple engineering formats (CSV, JSON, DXF). With no need for mechanical zeroing and an advanced auto-compensation algorithm for thermal expansion, the ProFiber delivers unparalleled consistency in precision measurement tasks crucial for quality control in semiconductor fabrication, flexible electronics manufacturing, and composite materials development. Engineers and makers looking to push the limits of measurement resolution on delicate materials now have a reliable, non-invasive tool that merges photonics with traditional metrology practices.
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