SpectraCal Precision Waveform Prober

$7,499.00

The SpectraCal Precision Waveform Prober redefines electronic diagnostics by enabling non-contact analysis of micro-scale waveforms down to 100 picoseconds rise times with picovolt sensitivity. Engineered for advanced electronics engineers, semiconductor testing labs, and high-precision hobbyists, this state-of-the-art tool leverages near-field terahertz time-domain spectroscopy (THz-TDS) combined with adaptive nano-positioning to detect, map, and analyze transient waveforms on live circuits without physical contact. Key Features: – Terahertz near-field scanning: Captures electromagnetic signals with a spatial resolution under 500 nm, surpassing standard oscilloscope probe capabilities. – Adaptive nano-positioning stage: Automated XYZ movement with closed-loop feedback enabling stable measurement on complex 3D assemblies. -…

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Description

The SpectraCal Precision Waveform Prober redefines electronic diagnostics by enabling non-contact analysis of micro-scale waveforms down to 100 picoseconds rise times with picovolt sensitivity. Engineered for advanced electronics engineers, semiconductor testing labs, and high-precision hobbyists, this state-of-the-art tool leverages near-field terahertz time-domain spectroscopy (THz-TDS) combined with adaptive nano-positioning to detect, map, and analyze transient waveforms on live circuits without physical contact.

Key Features:
– Terahertz near-field scanning: Captures electromagnetic signals with a spatial resolution under 500 nm, surpassing standard oscilloscope probe capabilities.
– Adaptive nano-positioning stage: Automated XYZ movement with closed-loop feedback enabling stable measurement on complex 3D assemblies.
– Real-time waveform reconstruction: Proprietary algorithm reconstructs partial signals obscured by noise or interference.
– Wideband bandwidth: 0.1 Hz to 20 GHz equivalent measurement range, allowing multi-layer PCB diagnostics and chip-scale device testing.
– Ultra-low electromagnetic interference design: Operates within shielded environments to ensure signal integrity.

Technical Specifications:
– Temporal resolution: 100 picoseconds
– Voltage sensitivity: <50 pV
– Spatial resolution: ~400 nm
– Positioning accuracy: ±10 nm
– Measurement range: DC to 20 GHz equivalent
– Interface: USB-C, Ethernet, with open-access API for data acquisition

How it works:
The SpectraCal Prober emits ultra-short terahertz pulses that interact with the electronic signals on the device under test. Sensitive detectors capture the reflected waveforms, which are processed to isolate the device’s micro-waveforms non-invasively. This allows technicians to diagnose ultra-fast transient phenomena and signal integrity issues without risking damage or introducing loading effects common with physical probes.

By transforming how high-frequency signals are analyzed, SpectraCal enables a new era of precision diagnostics essential for next-generation semiconductors, RF components, and advanced embedded systems.

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