Description
The VectraScan Pro 3D Micrometer represents a breakthrough in precision metrology, engineered for professionals requiring ultra-high fidelity surface profiling and dimensional measurement. Unlike traditional micrometers, the VectraScan Pro uses a proprietary combination of interferometric laser scanning and piezo-driven nanopositioning to capture true 3D surface topology with sub-nanometer vertical resolution and X/Y lateral accuracy down to 50 nanometers. Its compact ergonomic design integrates a high-resolution OLED touch interface and wireless connectivity for real-time data streaming and advanced modeling in CAD environments.
Key Features:
– Interferometric laser scanning sensor enables contactless measurement of delicate surfaces without deformation.
– Piezoelectric nanopositioning stage ensures precise probe movement with repeatability better than 5 nm.
– Native 3D point cloud output compatible with all major CAD and metrology software.
– Intelligent surface normal detection algorithm dynamically adjusts probe angle for complex geometries.
– Rugged aerospace-grade aluminum enclosure with IP54 sealing for industrial environments.
– Integrated AI-assisted anomaly detection flags out-of-tolerance features instantly.
– Fast calibration system using onboard reference standards reduces setup time by 70%.
– Wireless data export via Wi-Fi, Bluetooth, and USB-C for flexible integration.
Technical Specifications:
– Measurement Range: 0–25 mm depth, 50 mm width
– Vertical Resolution: 0.3 nm
– Lateral Accuracy: ±50 nm
– Scanning Speed: Up to 2000 points/sec
– Operating Temperature: 10–40°C
– Power: Rechargeable Li-ion battery (8 hours operation)
The VectraScan Pro 3D Micrometer is ideal for applications in aerospace component inspection, semiconductor wafer surface analysis, micro-machining quality control, and any high-precision manufacturing lines requiring reliable, repeatable 3D surface data. It elevates traditional micrometry into a new dimension, enabling users to detect nanoscale imperfections and dimensional deviations invisible to conventional tools.
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